High Performance CMOS Range Imaging: Device Technology and Systems ConsiderationsAndreas Süss CRC Press, 24 במרץ 2016 - 262 עמודים This work is dedicated to CMOS based imaging with the emphasis on the noise modeling, characterization and optimization in order to contribute to the design of high performance imagers in general and range imagers in particular. CMOS is known to be superior to CCD due to its flexibility in terms of integration capabilities, but typically has to be enhanced to compete at parameters as for instance noise, dynamic range or spectral response. This work gathers the widespread theory on noise and extends the theory by a non-rigorous but potentially computing efficient algorithm to estimate noise in time sampled systems. |
תוכן
1 Introduction | 1 |
2 State of the art range imaging | 5 |
3 Temporal noise | 25 |
4 Noise performance of devices available in the 035μm CMOS process | 67 |
5 Noise in active pixel sensors | 87 |
6 On the design of PMToF range imagers | 119 |
7 Conclusions | 191 |
Derivation of the autocorrelation formula of shot noise | 197 |
Measurement setups | 201 |
Photon transfer method | 205 |
Nomenclature | 207 |
Abbreviations | 213 |
| 215 | |
Back Cover | 230 |
מהדורות אחרות - הצג הכל
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Sss</span> אין תצוגה מקדימה זמינה - 2020 |
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Süss</span> אין תצוגה מקדימה זמינה - 2016 |
מונחים וביטויים נפוצים
accumulation count ambient illumination background illumination c.f. Section capacitance characteristics characterization charge carriers charge transfer circuit circuitry CMOS collection gate dark current defined demodulation depicted in Figure detector devices distribution emulated ToF principle enhancement-type Equation evaluated extrinsic quantum efficiency filter flicker noise floating diffusion frequency function image sensor implant input irradiance levels JFET Krzysztof Iniewski laser pulse LDPD linear method modulation MOSFET n-well NMOS NMOS-FETs noise performance noise processes noise sources object distance observed optical output voltage p-channel JFET parameters parasitic photodetector photon pixel PM ToF potential power spectral density quantum efficiency random process range imagers range measurement read noise readout structure referred noise reset noise sample setup short time integrator shot noise shutter signal source follower storage nodes TCAD TCAD simulation temporal noise thermal noise thin gate oxide time-of-flight time-variant systems time-varying TLDPD ToF-LDPD Tper transfer gates TTOF udem white noise width yield