High Performance CMOS Range Imaging: Device Technology and Systems ConsiderationsAndreas Süss CRC Press, 24 במרץ 2016 - 262 עמודים This work is dedicated to CMOS based imaging with the emphasis on the noise modeling, characterization and optimization in order to contribute to the design of high performance imagers in general and range imagers in particular. CMOS is known to be superior to CCD due to its flexibility in terms of integration capabilities, but typically has to be |
תוכן
1 Introduction | 1 |
2 State of the art range imaging | 5 |
3 Temporal noise | 25 |
4 Noise performance of devices available in the 035μm CMOS process | 67 |
5 Noise in active pixel sensors | 87 |
6 On the design of PMToF range imagers | 119 |
7 Conclusions | 191 |
Derivation of the autocorrelation formula of shot noise | 197 |
Measurement setups | 201 |
Photon transfer method | 205 |
Nomenclature | 207 |
Abbreviations | 213 |
| 215 | |
Back Cover | 230 |
מהדורות אחרות - הצג הכל
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Sss</span> אין תצוגה מקדימה זמינה - 2020 |
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Süss</span> אין תצוגה מקדימה זמינה - 2016 |
מונחים וביטויים נפוצים
according accumulation actual allow ambient applications approach approximately assumed becomes bias capacitance caused channel characteristics characterization charge charge carriers circuit CMOS compared components corresponds count defined demonstrated dependent depicted derivation described devices diffusion distance distribution doping effects electron employed Equation error estimation evaluated exhibit Figure filter fitting flicker noise follower frame frequency function gate given higher ideal illumination image sensor implant implemented increasing input instance integration introduced irradiance JFET laser LDPD light limited linear measurements method modulation n-well noise noise performance noise processes object observed operation output oxide parasitic performance photodetector photon pixel potential precision presented principle probability proper proposed pulse random range range imagers readout referred region relation reset response sample sensor shape shutter signal simulation spectral density standard storage nodes structure thermal transfer transistor varying voltage wave width yield