Random Testing of Digital Circuits: Theory and Applications

כריכה קדמית
CRC Press, 8 באפר׳ 1998 - 496 עמודים
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
 

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תוכן

Random Testing and BuiltIn SelfTest
1
Models for Digital Circuits and Fault Models
15
NOTES and REFERENCES
39
NOTES and REFERENCES
81
NOTES and REFERENCES
105
Basic Principles of Random Testing
107
NOTES and REFERENCES
133
NOTES and REFERENCES
164
NOTES and REFERENCES
247
NOTES and REFERENCES
276
NOTES and REFERENCES
296
NOTES and REFERENCES
334
Design For Random Testability
337
Postface
353
Exercises
411
Solutions to exercises
425

Random Test Length for Sequential Circuits
167
NOTES and REFERENCES
190
NOTES and REFERENCES
220
Random Test Length for Microprocessors
221
Bibliogra phy
447
Index
463
זכויות יוצרים

מונחים וביטויים נפוצים

קטעים בולטים

עמוד 459 - Test Generation for Microprocessors." IEEE Transactions on Computers, vol. C-29.
עמוד 461 - DA Wood, GA Gibson, and RH Katz. Verifying a Multiprocessor Cache Controller Using Random Test Generation.

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