High Performance CMOS Range Imaging: Device Technology and Systems ConsiderationsAndreas Süss CRC Press, 24 במרץ 2016 - 262 עמודים This work is dedicated to CMOS based imaging with the emphasis on the noise modeling, characterization and optimization in order to contribute to the design of high performance imagers in general and range imagers in particular. CMOS is known to be superior to CCD due to its flexibility in terms of integration capabilities, but typically has to be enhanced to compete at parameters as for instance noise, dynamic range or spectral response. This work gathers the widespread theory on noise and extends the theory by a non-rigorous but potentially computing efficient algorithm to estimate noise in time sampled systems. |
תוכן
| 4 | |
Temporal noise | 25 |
Noise in active pixel sensors | 80 |
On the design of PMToF range imagers | 113 |
Conclusions | 6-81 |
Measurement setups | 6-88 |
Abbreviations | 6-98 |
מהדורות אחרות - הצג הכל
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Süss</span> תצוגה מקדימה מוגבלת - 2016 |
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Sss</span> אין תצוגה מקדימה זמינה - 2020 |
High Performance CMOS Range Imaging: Device Technology and Systems ... <span dir=ltr>Andreas Süss</span> אין תצוגה מקדימה זמינה - 2016 |
מונחים וביטויים נפוצים
accumulation count active pixel sensors ambient illumination ambient light application background illumination bipolar transistors capacitance capacitor characterization charge carriers charge transfer circuit circuitry CMOS collection gate dark current defined demodulation depicted in Figure detector devices electron emulated ToF principle Equation evaluated extrinsic quantum efficiency filter flicker noise floating diffusion frame rate frequency function image sensor implant input irradiance levels JFET laser pulse LDPD linear method modulation MOSFET n-well NFD3 NMOS NMOS-FETs noise performance noise processes noise sources object distance optical p-channel parameters parasitic photoactive photodetector photodiode photogenerated charge photon pixel PM ToF potential power spectral density quantum efficiency range imagers range measurement readout structure referred noise resolution sample Schematic setup short time integrators shot noise shutter signal source follower storage nodes t₁ TCAD TCAD simulation temporal noise thermal noise thin gate oxide time-of-flight TLDPD ToF-LDPD triangulation TTOF wave white noise yield