Scientific Charge-coupled DevicesSPIE Press, 2001 - 906 עמודים The charge-coupled device (CCD) has recently celebrated its 30th birthday. The remarkable invention of Boyle and Smith of Bell Labs has dramatically changed the course of imaging in disciplines ranging from astronomy to biotechnology. James R. Janesick, an early proponent of the Scientific CCD, presents a careful and comprehensive history, tutorial and state-of-the-art description of the CCD. The book provides valuable reference information to scientists, engineers and hardware managers involved with imaging CCDs and high-performance camera systems, as well as those who need a comprehensive introduction to the subject. "Charge-Coupled Devices" is both a history of this development and a comprehensive reference manual on CCD and camera design, fabrication, operation, characterization and optimization. The key processes of CCD operation - charge collection, charge transfer and charge measurement - are described physically and illustrated by experimental data. Standards for characterizing and optimizing CCDs are presented in detail and the ultimate physical limitations on performance parameters discussed. Worked examples throughout provide valuable tutorials, and give the reader an appreciation for the level of performance that is being achieved by today's CCDs. |
תוכן
References | 92 |
Charge Collection | 107 |
References | 160 |
Charge Generation | 167 |
96 | 253 |
Measurement and Modeling Techniques | 338 |
References | 383 |
Extended Pixel Edge Response EPER | 418 |
Noise Sources | 605 |
Cosmic Rays and Radiation Interference | 670 |
References | 719 |
841 | |
Appendixes | 847 |
Glossary of CCD Terms | 871 |
899 | |
Charge Measurement | 489 |
מונחים וביטויים נפוצים
1/f noise approximately array Assume backside backside-illuminated CCD barrier phase bias camera gain capacitance channel stop charge packet charge transfer Charge-Coupled Devices constant dark current dark spikes depletion region device diffusion doping drain electric field electrons energy epitaxial equation example flash gate flat-field frequency frontside function histogram holes horizontal register implant increases interaction inverted ionization layer lumigen measured MOSFET noise floor operating temperature optimum output amplifier output transfer gate oxide phase-1 photon transfer pixel pixel nonuniformity PIXELS Figure plots problem QE performance QUANTUM EFFICIENCY quantum yield radiation rays read noise readout reset response sense node sensitivity sensor shield shot noise shown in Fig shows Si-SiO2 interface signal level silicon Solution spurious charge substrate thickness thinned transfer curve traps UV flood vertical registers voltage VREF wavelength WF/PC x-ray x-ray transfer
קטעים בולטים
עמוד 841 - Effects of space radiation damage and temperature on CCD noise for the Lyman FUSE mission, Photonics for Space Environments (E.